Figure 2
White-beam X-ray Laue topographs of the diamond crystal plates: (a) plate A, reflection, (b) plate A, reflection, (c) plate B, reflection and (d) plate B, reflection. For plate B, locations of stacking faults (SF1 and SF2) and plastic deformation (PD) are indicated by arrows. The horizontal lines dividing the topographs into three regions with slight variation in the background contrast are due to stitching of images from different X-ray films used for each crystal (due to the limited vertical size of the X-ray beam). The reference directions in the reciprocal lattice (common for all topographs) are shown in the center of the figure. |