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Figure 1
(a) Configuration of the normal-incidence HS X-AFM. The path of the X-ray beam is shown in dark blue. The sample is mounted upstream of the scanner (1). The cantilever and measurement system (2) are located upstream of the sample. (3) and (4) represent the alignment and long-range approach motors, respectively. The beam exits the scanner with a maximum half-angle of 35°. (b) HS X-AFM mounted in the nano hutch of ID13.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 23| Part 5| September 2016| Pages 1110-1117
https://doi.org/10.1107/S1600577516011437
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