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Figure 4
(a) Optical image of the AFM tip. This image is employed for the coarse alignment between the X-ray beam and the tip. (b) Scanning transmission X-ray microscopy showing the AFM tip in a scan approximately 20 times smaller than the image presented in (a). This measurement is used for the fine alignment between tip and X-ray beam.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 23| Part 5| September 2016| Pages 1110-1117
https://doi.org/10.1107/S1600577516011437
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