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![[Figure 1]](gb5033fig1mag.jpg)
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Figure 1
Simplified schematic of the experimental arrangement for simultaneous collection of SXDM and XFM data (a). An in-vacuum undulator (IVU) and horizontal secondary-source aperture (SSA-H) define the vertical and horizontal source positions. A KB mirror pair is used to create a 2.5 µm focus, while a 100 µm pinhole (PH) 5 cm upstream of the focus, combined with the aperture through the Maia detector, remove parasitic scatter from upstream optics. The EIGER 1M detector was placed 3.67 m downstream of the focus with a He-filled flight tube (not shown) installed between the specimen and the EIGER detector to reduce air scatter. All distances are relative to the focus in metres. For simplicity, some upstream optics are not shown and the figure is not to scale. Step- and fly-scan trajectories are shown in (b) and (c), respectively, with the points in (b) representing the sampling locations and the boxes in (c) representing the extended trajectories over which diffraction data were acquired. |
![[Figure 1]](gb5033fig1.jpg)
 | JOURNAL OF SYNCHROTRON RADIATION |
ISSN: 1600-5775
