view article
Figure 3
SXDM (a) and XFM maps for Cr (b) and Au (c) of the test pattern in fly-scan mode, with zoomed regions in (d)–(f) taken from the box in (a). Once again, we see the increased resolution in the SXDM image; however, as the total scan time is an order of magnitude faster, fewer fluorescent photons were detected, resulting in poorer fluorescent maps. The scale bar in (a) is equal to 10 µm.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 23| Part 5| September 2016| Pages 1151-1157
https://doi.org/10.1107/S1600577516011917
Follow J. Synchrotron Rad.
Sign up for e-alerts
E-alerts
Follow J. Synchrotron Rad. on Twitter
Twitter
Follow us on facebook
Facebook
Sign up for RSS feeds
RSS