|
Figure 5
NEXAFS spectrum given by the Cu-LVV Auger-electron peak intensity. The Cu-L3 absorption edge is investigated in the pump–probe mode. The (blue) solid line represents the non-coincident (total) Auger-electron count rate that is related to pure X-ray excitation, scaled down by more than four orders of magnitude. The symbols with statistical error bars show the fractional Cu-LVV count rate in coincidence with 6034 synchronized IR laser pulses per second (the mean laser power is 150 mW), the so-called gated yield. |