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Figure 5
NEXAFS spectrum given by the Cu-LVV Auger-electron peak intensity. The Cu-L3 absorption edge is investigated in the pump–probe mode. The (blue) solid line represents the non-coincident (total) Auger-electron count rate that is related to pure X-ray excitation, scaled down by more than four orders of magnitude. The symbols with statistical error bars show the fractional Cu-LVV count rate in coincidence with 6034 synchronized IR laser pulses per second (the mean laser power is 150 mW), the so-called gated yield.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 23| Part 5| September 2016| Pages 1158-1170
https://doi.org/10.1107/S1600577516009115
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