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Figure 2
Photograph of the portable metrology device installed on B16 beamline for the characterization of X-ray mirrors. The mirror is installed upstream of the membrane stage and is therefore not visible in the above figure.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 23| Part 5| September 2016| Pages 1131-1136
https://doi.org/10.1107/S1600577516012509
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