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Figure 3
(a) Example of the intensity probability distribution P(k) calculated for q = 0.005 Å−1 from a single-pulse speckle pattern. The solid line represents the best fit to a negative binomial distribution [equation (2)[link]] for kavg = 24.0 ± 0.2 photons and Meff = 2.35 ± 0.20. (b) The average number of photons kavg, (c) the effective number of transverse modes Meff at different wavevector transfers q and (d) the normalized standard deviation C calculated from equation (3)[link]. The red dashed line in (b) is a low q part of the small-angle X-ray scattering curve from Fig. 2(b)[link]. The dashed line in (c) marks Meff = 2.35. Data points in (b), (c) and (d) are averages of the fitting parameters over 1100 individual patterns of similar exposure levels.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 23| Part 5| September 2016| Pages 1171-1179
https://doi.org/10.1107/S1600577516010869
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