Determination of the packing fraction in photonic glass using synchrotron radiation nanotomography

Ogurreck, M.; Rosario, J.J. do; Leib, E.W.; Laipple, D.; Greving, I.; Marschall, F.; Last, A.; Schneider, G.A.; Vossmeyer, T.; Weller, H.; Beckmann, F.; Müller, M.

doi:10.1107/S1600577516012960

Journal of Synchrotron Radiation Journal of
Synchrotron Radiation

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Figure 8
SEM image of the FIB slicing surface used for determination of the packing fraction. FIB curtaining effects can be seen in the right part of the sample and are caused by the large sample size and ion beam defocusing.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 23| Part 6| November 2016| Pages 1440-1446

https://doi.org/10.1107/S1600577516012960

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