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Figure 4
XRF sum spectrum of thin-film standard RF11 prepared by AXO Dresden GmbH measured over an area of 1 mm × 1 mm with 4 µm pixel size and a dwell time of 20 ms per pixel at an incident energy of 12 keV, thus a total of 1250 s. The gray dotted line shows a full XRF spectrum collected at a single image pixel for 20 ms.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 23| Part 6| November 2016| Pages 1550-1560
https://doi.org/10.1107/S1600577516015289
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