Figure 7
Schematic drawing of the setup for XRD experiments under high pressure at the XDS beamline. The X-rays beam size (100 µm × 100 µm) is defined by two sets of slits. An area detector collects the diffraction pattern from the sample. An optical system placed on the side is used to calibrate the pressure using the ruby luminescence method by rotating the DAC by 90° relative to the original angle used to collect the X-ray diffraction data. Dimensions are given in millimeters. |