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Figure 8
Experimental and simulated XRD patterns of a powdered EuGa4 sample at 300 K for some selected pressures. The broad extra peak near 14° (indicated by * in the figure) is due to the small amount of Ga excess present on the surface of the crystals in the as-grown samples. All the other extra peaks come from the stainless-steel gasket.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 23| Part 6| November 2016| Pages 1538-1549
https://doi.org/10.1107/S160057751601403X
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