KB scanning of X-ray beam for Laue microdiffraction on accelero-phobic samples: application to in situ mechanically loaded nanowires

Leclere, C.; Cornelius, T.W.; Ren, Z.; Robach, O.; Micha, J.-S.; Davydok, A.; Ulrich, O.; Richter, G.; Thomas, O.

doi:10.1107/S1600577516013849

Figure 2
Calibration curves for the beam scanning pseudo-motors. (a) Angular method: displacement and full width at half-maximum (FWHM) of the beam focus on the sample surface as a function of the rotation of the downstream mirror. (b) and (c) Translation method: (b1) Micro-beam position in x direction (circles) and error on x position (squares) as a function of d(ty₂). (b2) Micro-beam size along x (circles) and intensity (squares) versus d(ty₂). The vertical red lines mark the edges of the beam impinging on the mirror at d(ty₂) = 0 (best focus). The mirror edges coincide with the slit center at d(ty₂) = −120 µm (black dashed vertical line) and d(ty₂) = +240 µm (out of the graph). The ty₂ scanning range with optimal beam properties (high intensity and small size) has a width of 80 µm as indicated by the blue horizontal line. (c1) Micro-beam position in y direction (circles) and error on y position (squares) as a function of d(tz₁). (c2) Micro-beam size along y (circles) and intensity (squares) versus the tz₁ offset of the first KB mirror. The tz₁ scan range with optimal beam size has a width of 40 µm as indicated by the blue horizontal line.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 23| Part 6| November 2016| Pages 1395-1400

https://doi.org/10.1107/S1600577516013849

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