Figure 1
Optical scheme of the TwinMic beamline with short undulator X-ray source (SU5.6), pinhole (PH), collimating cylindrical mirror (M1), plane-grating monochromator [plane mirror (M2) and plane grating (G)], refocusing toroidal mirror (M3) and secondary X-ray source (SS). The TwinMic microscope end-station, comprising zone plates, sample and CCD is indicated, and will be described in detail in §3. |