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Figure 7
(a) Reflection (311) of NIST standard Si (SRM 640d) analyzed inside capillaries with three different diameters (0.3, 0.5 and 0.7 mm). (b) Reflections (642) and (553) of Si obtained inside a 0.3 mm-diameter capillary.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 23| Part 6| November 2016| Pages 1501-1506
https://doi.org/10.1107/S1600577516012686
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