Micrometer-resolution imaging using MÖNCH: towards G2-less grating interferometry

Cartier, S.; Kagias, M.; Bergamaschi, A.; Wang, Z.; Dinapoli, R.; Mozzanica, A.; Ramilli, M.; Schmitt, B.; Brückner, M.; Fröjdh, E.; Greiffenberg, D.; Mayilyan, D.; Mezza, D.; Redford, S.; Ruder, C.; Schädler, L.; Shi, X.; Thattil, D.; Tinti, G.; Zhang, J.; Stampanoni, M.

doi:10.1107/S1600577516014788

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Figure 6
Cumulative distribution $[(\eta_x,\eta_y)]$ for a flat-field measurement acquired at 16.7 keV, using a 320 µm-thick sensor biased at 90 V. The rendered grid shows the partitions of the bins H_(x,y) resulting from the iterative algorithm described in §4

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 23| Part 6| November 2016| Pages 1462-1473

https://doi.org/10.1107/S1600577516014788

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