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Figure 6
Simulated temperature in a nanowire transistor with 100 nm-thick Au contacts, as viewed along the beam direction, the z-axis. The beam properties are the same as in Fig. 3(a)[link]. (a) Drawing of the sample. (b) Temperature when the beam is incident at the centre of the nanowire at x = 0. (c) Temperature when the beam is incident at the left contact, at x = −1 µm. The same colour scale was used in (b) and (c).

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 24| Part 5| September 2017| Pages 925-933
https://doi.org/10.1107/S1600577517008712
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