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![[Figure 1]](gb5052fig1mag.jpg)
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Figure 1
Sample overview. (a) Optical micrograph of the sample, showing the micro-crystal and the surrounding area cleared using FIB. The scalebar corresponds to 50 µm. (b) SEM micrograph of the micro-crystal after FIB milling. The holes near the crystal are locations where adjacent crystals were removed using localized FIB milling. (c) Superimposed morphologies of the micro-crystal recovered from BCDI measurements of six different crystal reflections. Morphologies are rendered semi-transparent to allow examination of their agreement. (d) Mean morphology recovered from all BCDI measurements. (e) High-resolution SEM micrograph of the micro-crystal. (c), (d) and (e) are all shown at the same magnification, viewing the sample from the same direction and in the same orientation. Scalebars in (b)–(e) correspond to 500 nm. |
![[Figure 1]](gb5052fig1.jpg)
 | JOURNAL OF SYNCHROTRON RADIATION |
ISSN: 1600-5775
