view article
Figure 3
Laue micro-diffraction pattern collected from the micro-crystal. Square boxes show micro-crystal reflections that were used for orientation determination. The corresponding hkl indices are shown in red. Circles represent locations where further, weaker reflections from the micro-crystal are expected. Other intense peaks in the diffraction pattern belong to the silicon substrate and are not indexed here for clarity.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 24| Part 5| September 2017| Pages 1048-1055
https://doi.org/10.1107/S1600577517009183
Follow J. Synchrotron Rad.
Sign up for e-alerts
E-alerts
Follow J. Synchrotron Rad. on Twitter
Twitter
Follow us on facebook
Facebook
Sign up for RSS feeds
RSS