Figure 1
(a)–(e) SEM images of the focused ion beam sample preparation. (a) nw1 in the as-grown state. (b) nw1 after the FIB treatment to clean its surrounding from parasitic islands and after reducing its length (c). (d) Top view of the nanowires cross section after the final FIB treatment. (e, f) Overview images which show that multiple nanowires were prepared in a similar fashion. (f) Schematic of the experimental setup which shows the focusing Fresnel zone plate (FZP), beam stop (BS) and order-sorting aperture (OSA). The focused beam is almost fully coherent and when centred on the NW of interest leads to the observation of a speckle pattern. When several 2D images are combined to a 3D reciprocal-space map an intensity distribution as shown in the 3D contour plot is observed. |