Characterization of individual stacking faults in a wurtzite GaAs nanowire by nanobeam X-ray diffraction

Davtyan, A.; Lehmann, S.; Kriegner, D.; Zamani, R.R.; Dick, K.A.; Bahrami, D.; Al-Hassan, A.; Leake, S.J.; Pietsch, U.; Holý, V.

doi:10.1107/S1600577517009584

Journal of Synchrotron Radiation Journal of
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Figure 2
Scanning X-ray diffraction images of nw1 and nw2 and their surrounding for various Bragg peaks are shown. Images created by the GaAs ZB $[(\bar{3}\bar{3}\bar{1})]$ , WZ $[(01\bar{1}\bar{5})]$ and twinned ZB $[(\bar{2}\bar{2}\bar{4})]$ Bragg peaks are shown in panels (a, d), (b, e) and (c, f), respectively. The colour scale is adjusted to yield an appropriate contrast within the image. Especially at the $[(\bar{3}\bar{3}\bar{1})]$ peak the constant contribution of the substrate is ignored. The NW appears as an elongated object since the incidence angles at the Bragg conditions are between 59 and 62°.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 24| Part 5| September 2017| Pages 981-990

https://doi.org/10.1107/S1600577517009584

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