Characterization of individual stacking faults in a wurtzite GaAs nanowire by nanobeam X-ray diffraction

Davtyan, A.; Lehmann, S.; Kriegner, D.; Zamani, R.R.; Dick, K.A.; Bahrami, D.; Al-Hassan, A.; Leake, S.J.; Pietsch, U.; Holý, V.

doi:10.1107/S1600577517009584

Journal of Synchrotron Radiation Journal of
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Figure 4
Types of SFs in wurtzite lattice. The horizontal dashed line represents the position of the fault plane, and the dotted rectangles denote small face-centred-cubic-like segments with ABCABC… stacking.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 24| Part 5| September 2017| Pages 981-990

https://doi.org/10.1107/S1600577517009584

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