Characterization of individual stacking faults in a wurtzite GaAs nanowire by nanobeam X-ray diffraction

Davtyan, A.; Lehmann, S.; Kriegner, D.; Zamani, R.R.; Dick, K.A.; Bahrami, D.; Al-Hassan, A.; Leake, S.J.; Pietsch, U.; Holý, V.

doi:10.1107/S1600577517009584

Figure 5
(a) Reciprocal-lattice points of ZB (black), WZ (red) and twinned ZB lattices (blue). The vertical black line denotes the trajectory of the Q_z-scans considered in this paper, and the dashed rectangle corresponds to the Q_z-range used in panel (b). (b) The diffraction curve simulated for a pair of I1-type stacking faults in positions n₁ = 400 and n₂ = 600 and using various effective coherence widths L_coh. The parameters of the curves are the coherence widths expressed as multiples of the distances d_WZ of the (0001) basal planes. The black and magenta rectangles denote the Q_z-windows used for the calculation of the Patterson function; the shape of the Planck-taper window function is indicated by the small graphs in the rectangles. (c) The Patterson functions calculated from the diffraction curves in panel (b); the black and magenta curves were obtained using the black and magenta Q_z-windows in (b), respectively. The vertical blue, red and green lines denote the maxima of the Patterson functions; see the main text for details. (d) The Patterson functions calculated for zero, one, two and three stacking faults of type I1; the positions n_t of the SFs are the parameters of the curves. In the calculation the coherence width L_coh = 5000d_WZ was used. In panels (c) and (d) the vertical dotted line N denotes the peak corresponding to the finite length of the nanowire. The curves in panels (b) to (d) are shifted vertically.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 24| Part 5| September 2017| Pages 981-990

https://doi.org/10.1107/S1600577517009584

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