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Figure 9
(a) Bright TEM overview image of an exemplary GaAs NW lamella with the substrate, NW body and FIB-redeposited shell post coloured for better visibility. A selected area diffraction pattern of the entire NW (b) and a convoluted dark-field image of the the base (c) using the diffraction spots for imaging as indicated in (b) show the mixed crystal structure at the base. A dark-field image of nw1 is given in (d) using the diffraction spot marked blue in (b) showing the stacking defects as brighter contrast lines in the otherwise darker WZ nanowire body. HRTEM details of the three stacking defects in the area of interest are given in (e)–(g) with coloured circles indicating the different bilayer stacking order.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 24| Part 5| September 2017| Pages 981-990
https://doi.org/10.1107/S1600577517009584
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