Investigation of nanoparticulate silicon as printed layers using scanning electron microscopy, transmission electron microscopy, X-ray absorption spectroscopy and X-ray photoelectron spectroscopy

Unuigbe, D.M.; Harting, M.; Jonah, E.O.; Britton, D.T.; Nordlund, D.

doi:10.1107/S1600577517009857

Journal of Synchrotron Radiation Journal of
Synchrotron Radiation

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Figure 7
(a) Normalized O 1s-edge XANES plot of printed nanoparticulate silicon layers on paper substrate (metallurgical silicon milled for 1–5 h). (b) Relative intensity of the π to σ resonance peak of printed nanoparticulate silicon layers with respect to nanoparticle milling time.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 24| Part 5| September 2017| Pages 1017-1023

https://doi.org/10.1107/S1600577517009857

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