The EIGER detector for low-energy electron microscopy and photoemission electron microscopy

Tinti, G.; Marchetto, H.; Vaz, C.A.F.; Kleibert, A.; Andrä, M.; Barten, R.; Bergamaschi, A.; Brückner, M.; Cartier, S.; Dinapoli, R.; Franz, T.; Fröjdh, E.; Greiffenberg, D.; Lopez-Cuenca, C.; Mezza, D.; Mozzanica, A.; Nolting, F.; Ramilli, M.; Redford, S.; Ruat, M.; Ruder, Ch.; Schädler, L.; Schmidt, Th.; Schmitt, B.; Schütz, F.; Shi, X.; Thattil, D.; Vetter, S.; Zhang, J.

doi:10.1107/S1600577517009109

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Figure 4
(a) Map of the `untrimmed' flat-field correction for the EIGER detector (where the area at the edge where the Al has not been completely etched away has been masked), with threshold set at 8.5 keV. (b) Corresponding flat-field correction map for the detector, with threshold set at 8.5 keV and `trimmed' configuration.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 24| Part 5| September 2017| Pages 963-974

https://doi.org/10.1107/S1600577517009109

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