The EIGER detector for low-energy electron microscopy and photoemission electron microscopy

Tinti, G.; Marchetto, H.; Vaz, C.A.F.; Kleibert, A.; Andrä, M.; Barten, R.; Bergamaschi, A.; Brückner, M.; Cartier, S.; Dinapoli, R.; Franz, T.; Fröjdh, E.; Greiffenberg, D.; Lopez-Cuenca, C.; Mezza, D.; Mozzanica, A.; Nolting, F.; Ramilli, M.; Redford, S.; Ruat, M.; Ruder, Ch.; Schädler, L.; Schmidt, Th.; Schmitt, B.; Schütz, F.; Shi, X.; Thattil, D.; Vetter, S.; Zhang, J.

doi:10.1107/S1600577517009109

Figure 7
X-PEEM images of supported iron nanoparticles recorded with the X-ray photon energy set to the Fe L₃-edge at about 709 eV using the MCP (left column) and the EIGER (right column). (a)–(b) Images with contrast optimized to observe the Au marker structures. Nanoparticles are seen in both images as fainter spots. (c)–(d) The same images but with the contrast optimized to visualize the nanoparticle signal. Insets show line scans extracted along the dashed lines and normalized to the substrate intensity. (e)–(f) Flat-field and drift-corrected images with line scans in the insets. For the MCP detector this processing leads to a much better contrast of the nanoparticles, while it gives only a marginal improvement for the EIGER. The red arrows indicate the signal of two nanoparticles. Yellow arrows highlight some artefacts in the EIGER detector image originating from the residual Al layer and their removal by the flat-field normalization. Orange arrows highlight the removal of subtle inhomogeneities of the EIGER detector. The dark areas at the bottom and the right-hand side of (f) are not EIGER detector features but result from the sample drift correction.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 24| Part 5| September 2017| Pages 963-974

https://doi.org/10.1107/S1600577517009109

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