The EIGER detector for low-energy electron microscopy and photoemission electron microscopy

Tinti, G.; Marchetto, H.; Vaz, C.A.F.; Kleibert, A.; Andrä, M.; Barten, R.; Bergamaschi, A.; Brückner, M.; Cartier, S.; Dinapoli, R.; Franz, T.; Fröjdh, E.; Greiffenberg, D.; Lopez-Cuenca, C.; Mezza, D.; Mozzanica, A.; Nolting, F.; Ramilli, M.; Redford, S.; Ruat, M.; Ruder, Ch.; Schädler, L.; Schmidt, Th.; Schmitt, B.; Schütz, F.; Shi, X.; Thattil, D.; Vetter, S.; Zhang, J.

doi:10.1107/S1600577517009109

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Figure 8
Drift-corrected X-PEEM images of supported iron nanoparticles recorded using the MCP (left column) and the EIGER (right column). (a)–(b) Elemental contrast maps, in which the signal of the Fe-containing parts of the sample is enhanced with both detectors. (c)–(d) Magnetic contrast maps obtained from flat-field and drift-corrected X-PEEM images recorded with right- and left-circularly polarized light.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 24| Part 5| September 2017| Pages 963-974

https://doi.org/10.1107/S1600577517009109

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