Simulations of X-ray diffraction of shock-compressed single-crystal tantalum with synchrotron undulator sources

Tang, M.X.; Zhang, Y.Y.; E, J.C.; Luo, S.N.

doi:10.1107/S160057751800499X

Journal of Synchrotron Radiation Journal of
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Figure 10
Snapshots of atomic configurations for (a) u_p = 0.75 km s⁻¹ at 15 ps and (b) 2 km s⁻¹ at 10 ps. (c) Diffractionpatternand2θ–γ map for the ( $[\bar{1}{1}2]$ ) reflection corresponding to (a). (d) Diffraction pattern corresponding to (b). Color coding is based on common neighbor analysis for (a) and (b) and scattering intensity for (c) and (d). Shock direction: [100]; incident beam direction: [100]; no edge release.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 25| Part 3| May 2018| Pages 748-756

https://doi.org/10.1107/S160057751800499X

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