Simulations of X-ray diffraction of shock-compressed single-crystal tantalum with synchrotron undulator sources

Tang, M.X.; Zhang, Y.Y.; E, J.C.; Luo, S.N.

doi:10.1107/S160057751800499X

Journal of Synchrotron Radiation Journal of
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Figure 7
Snapshots of diffraction patterns (top row) for the ( $[\bar{2}\bar{2}2]$ ) reflection, and the γ–2θ maps (bottom row) corresponding to the area delimited by the dotted rectangle in the diffraction pattern. Color coding is based on scattering intensity. Shock direction: [100]; incident beam direction: [100]; piston velocity: 0.2 km s⁻¹; no edge release.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 25| Part 3| May 2018| Pages 748-756

https://doi.org/10.1107/S160057751800499X

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