High-speed tomography under extreme conditions at the PSICHE beamline of the SOLEIL Synchrotron

Boulard, E.; King, A.; Guignot, N.; Deslandes, J.-P.; Le Godec, Y.; Perrillat, J.-P.; Clark, A.; Morard, G.; Itié, J.-P.

doi:10.1107/S1600577518004861

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Figure 1
Center: first and last image of a tomogram recorded with a 20 min acquisition time in the RoToPEC apparatus at 3 GPa, 1800 K. The black areas at the top and bottom of the sample are due to the absorption from the PE anvils. One can see the opening gate between these anvils shortening upon the acquisition of the tomogram due to the flow of the sample and sample environment at these high temperatures. Attempted reconstructed slices are presented on the left and right, which present a large artefact because of the sample movement upon acquisition.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 25| Part 3| May 2018| Pages 818-825

https://doi.org/10.1107/S1600577518004861

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