Quick X-ray reflectivity using monochromatic synchrotron radiation for time-resolved applications

Joress, H.; Brock, J.D.; Woll, A.R.

doi:10.1107/S1600577518003004

Journal of Synchrotron Radiation Journal of
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Figure 7
Three comparisons of qXRR and Parratt reflectivity: (a) low- and (b) high- $[{\bf{q}}_{z}]$ region of the reflectivity curve from a 15 nm Bi₂Ru₂O₇ epitaxial pyrochlore film on a YSZ (111) substrate. (c) Reflectivity from a TiO₂/TiN multilayer on Si with 13 bilayers and a total thickness of 76 nm. Counts are normalized to the unattenuated part of the qXRR curve.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 25| Part 3| May 2018| Pages 706-716

https://doi.org/10.1107/S1600577518003004

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