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Figure 4
Schematic of the geometry of the asymmetric slits used for diffraction measurements (with expanded vertical scale), showing the slit width w, slit offset t, diffraction angle φ, maximum path length difference [\Delta \equiv \ell - t] and apparent slit width a.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 25| Part 4| July 2018| Pages 1036-1047
https://doi.org/10.1107/S1600577518006501
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