Xi-cam: a versatile interface for data visualization and analysis

Pandolfi, R.J.; Allan, D.B.; Arenholz, E.; Barroso-Luque, L.; Campbell, S.I.; Caswell, T.A.; Blair, A.; De Carlo, F.; Fackler, S.; Fournier, A.P.; Freychet, G.; Fukuto, M.; Gürsoy, D.; Jiang, Z.; Krishnan, H.; Kumar, D.; Kline, R.J.; Li, R.; Liman, C.; Marchesini, S.; Mehta, A.; N'Diaye, A.T.; Parkinson, D.Y.; Parks, H.; Pellouchoud, L.A.; Perciano, T.; Ren, F.; Sahoo, S.; Strzalka, J.; Sunday, D.; Tassone, C.J.; Ushizima, D.; Venkatakrishnan, S.; Yager, K.G.; Zwart, P.; Sethian, J.A.; Hexemer, A.

doi:10.1107/S1600577518005787

Journal of Synchrotron Radiation Journal of
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Figure 3
Cartographic (q_x, q_z) transformation from raw CDSAXS data. The vertical lines indicate locations where one-dimensional peak profiles would be extracted for fitting. Fitting these profiles can provide estimations for critical dimensions of the periodic form factor.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 25| Part 4| July 2018| Pages 1261-1270

https://doi.org/10.1107/S1600577518005787

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