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Figure 5
(a) Temperature variation of the cryogenic pot during a tomography XDI experiment. The arrows indicate the adjustment of a needle valve attached to the scroll pump. Small spikes appearing in the temperature variation had little influence on the experiment. (b) Theoretical curves of the intensity (red line) and phase (blue line) in the diffraction pattern from a pinhole with a diameter of 38 µm expected at the specimen position (Fig. 4b[link]). Panels (c) and (d) show the intensity profiles in the diffraction pattern from a pinhole of 38 µm diameter (red lines and dots) in the vertical and horizontal directions, respectively. The profiles are calculated as the derivative of the intensity variation (black lines and dots) measured by the knife-edge scans. (e) Diffraction pattern from a cuboid-shaped cuprous oxide particle with an approximate size of 580 nm recorded after an adjustment of the silicon slits. (f) Line profile along one of the flares (white line) in the cross-shaped diffraction pattern.

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