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Figure 6
(a) Series of diffraction patterns from C. merolae during a successive 1.5° rotation around φ = −155° (upper panel), and those picked up at an interval of 12.0° (lower panel). The resolution at the edge is 5.62 µm−1, corresponding to 178 nm in real space. Variation of the Csym values (b) and maximum resolution (c) of the diffraction patterns plotted against the rotation angle. (d) Distribution of diffraction intensity in the Sy–Sz planes at Sx = 1.1 (left panel), 0.0 (center) and −1.1 µm−1 (right). The resolution at the edge is 14.7 µm−1, corresponding to 68.0 nm in real space. (e) The resolution-dependent variation of radially averaged diffraction intensity.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 25| Part 6| November 2018| Pages 1803-1818
https://doi.org/10.1107/S1600577518012687
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