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Figure 7
(a) Variation of the surface and interface-layer valence with thickness as predicted by theory. As each layer follows similar thickness-dependent trends, equations (2)[link] and (3)[link] were employed and the resulting dashed lines are shown. Here Vsurf-n (Vint-n) refers to the valence of the nth layer from the surface (interface). (b) Thickness dependence of the surface and interface-length scales, Ls and Lint, as determined by fitting the theoretical data in Fig. 4[link] to equation (1)[link]. Points below 5 u.c. have been omitted as there are a sufficient number of parameters to fit equation (1)[link] exactly to the data, i.e. the error is zero.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 25| Part 6| November 2018| Pages 1711-1718
https://doi.org/10.1107/S1600577518011724
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