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Figure 16
Concentric rings sample (left) and simulated diffraction pattern created by it as observed at 4.81 m (right): `ideal' fabrication error-free case (upper image plots) and the case of a sample object generated for simulations from a real nano-fabricated sample (lower image plots). The outermost diameter/size of both samples is ∼1.35 µm. The simulations were performed with the NSLS-II CHX beamline layout.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 25| Part 6| November 2018| Pages 1877-1892
https://doi.org/10.1107/S1600577518010986
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