Implications of X-ray beam profiles on qualitative and quantitative synchrotron micro-focus X-ray fluorescence microscopy

Morrell, A.P.; Mosselmans, J.F.W.; Geraki, K.; Ignatyev, K.; Castillo-Michel, H.; Monksfield, P.; Warfield, A.T.; Febbraio, M.; Roberts, H.M.; Addison, O.; Martin, R.A.

doi:10.1107/S160057751801247X

Journal of Synchrotron Radiation Journal of
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Figure 10
Ti XRF map recorded at ID21. (a) Original Ti XRF map. (b) After beam-profile correction. (c) After adaptive-subtraction. The coloured bar represents the number of counts, displayed on a logarithmic scale.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 25| Part 6| November 2018| Pages 1719-1726

https://doi.org/10.1107/S160057751801247X

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