Implications of X-ray beam profiles on qualitative and quantitative synchrotron micro-focus X-ray fluorescence microscopy

Morrell, A.P.; Mosselmans, J.F.W.; Geraki, K.; Ignatyev, K.; Castillo-Michel, H.; Monksfield, P.; Warfield, A.T.; Febbraio, M.; Roberts, H.M.; Addison, O.; Martin, R.A.

doi:10.1107/S160057751801247X

Journal of Synchrotron Radiation Journal of
Synchrotron Radiation

IUCr IT WDC

home archive editors for authors for readers submit subscribe open access

view article

Figure 9
Ti XRF maps showing the adaptive subtraction (a) before the correction and (b) after the correction. The coloured bar represents mass fraction, displayed on a logarithmic scale.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 25| Part 6| November 2018| Pages 1719-1726

https://doi.org/10.1107/S160057751801247X

Follow J. Synchrotron Rad.

Search IUCr Journals		doi		Advanced search
Author		volume	page