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Figure 2
Dynamic measurement of the vertical size of the X-ray beam on the I24 beamline using knife-edge scans. This method provides an accurate measurement of the beam size but at the expense of reduced time sensitivity (the duration of each scan is ∼2 min). There is no discernible drift in the size of the X-ray beam, which illustrates the quality of the improved opto-mechanical holders for the bimorphs.

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ISSN: 1600-5775
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