The Single Particles, Clusters and Biomolecules and Serial Femtosecond Crystallography instrument of the European XFEL: initial installation

Mancuso, A.P.; Aquila, A.; Batchelor, L.; Bean, R.J.; Bielecki, J.; Borchers, G.; Doerner, K.; Giewekemeyer, K.; Graceffa, R.; Kelsey, O.D.; Kim, Y.; Kirkwood, H.J.; Legrand, A.; Letrun, R.; Manning, B.; Lopez Morillo, L.; Messerschmidt, M.; Mills, G.; Raabe, S.; Reimers, N.; Round, A.; Sato, T.; Schulz, J.; Signe Takem, C.; Sikorski, M.; Stern, S.; Thute, P.; Vagovič, P.; Weinhausen, B.; Tschentscher, T.

doi:10.1107/S1600577519003308

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Figure 6
Representation of the vertical optical layout of the SPB/SFX instrument. The incident beam from XTD9 is shown in red, with the 1 µm-scale system in green and the 100 nm-scale system in blue. The 0 m mark in the longitudinal distance denotes the common focal plane of the two systems. Figure adapted from Bean et al. (2016

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 26| Part 3| May 2019| Pages 660-676

https://doi.org/10.1107/S1600577519003308

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