On-line monitoring of the spatial properties of hard X-ray free-electron lasers based on a grating splitter

Hua, W.; Zhou, G.; Hu, Z.; Yang, S.; Liao, K.; Zhou, P.; Dong, X.; Wang, Y.; Bian, F.; Wang, J.

doi:10.1107/S1600577519001681

Journal of Synchrotron Radiation Journal of
Synchrotron Radiation

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Figure 6
The rough grating used in the simulation (δ = 400 nm and l = 500 nm). The scalar bar was used for both images and demonstrates the percentage of the grating height. An enlarged image is given on the right-hand side as indicated by the orange box and the arrow.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 26| Part 3| May 2019| Pages 619-628

https://doi.org/10.1107/S1600577519001681

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