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Figure 5
Out-of-plane XRD results of Cr/C multilayers with different Cr thickness ratios. (a) Patterns measured in asymmetrical reflection mode. The two inserts are enlarged views of the area marked by the black frames. (b) Patterns measured in symmetrical reflection mode.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
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