Structure, stress and optical properties of Cr/C multilayers for the tender X-ray range

Feng, J.; Huang, Q.; Wang, H.; Yang, X.; Giglia, A.; Xie, C.; Wang, Z.

doi:10.1107/S1600577519001668

Journal of Synchrotron Radiation Journal of
Synchrotron Radiation

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Figure 5
Out-of-plane XRD results of Cr/C multilayers with different Cr thickness ratios. (a) Patterns measured in asymmetrical reflection mode. The two inserts are enlarged views of the area marked by the black frames. (b) Patterns measured in symmetrical reflection mode.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 26| Part 3| May 2019| Pages 720-728

https://doi.org/10.1107/S1600577519001668

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