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 | JOURNAL OF SYNCHROTRON RADIATION |
accessSwissFEL Aramis beamline photon diagnostics. Erratum
aSwissFEL, Paul Scherrer Institut, Villigen 5232, Switzerland, bDepartment of Microelectronics and Nanoelectronics, University of Malta, Msida, Malta, cPaul Scherrer Institut, Villigen 5232, Switzerland, dCERN, Geneva 1211, Switzerland, eDESY, Notkestrasse 85, Hamburg 22607, Germany, fIoffe Physico-Technical Institute, Politekhnicheskaya 26, St Petersburg 194021, Russia, and gEuropean XFEL, Holzkoppel 4, Schenefeld 22869, Germany
*Correspondence e-mail: pavle.juranic@psi.ch
The list of authors in the paper by Juranić et al. (2018![[Juranić, P., Rehanek, J., Arrell, C. A., Pradervand, C., Ischebeck, R., Erny, C., Heimgartner, P., Gorgisyan, I., Thominet, V., Tiedtke, K., Sorokin, A., Follath, R., Makita, M., Seniutinas, G., David, C., Milne, C. J., Lemke, H., Radovic, M., Hauri, C. P. & Patthey, L. (2018). J. Synchrotron Rad. 25, 1238-1248.]](../../../../../../logos/arrows/s_arr.gif "Juranić, P., Rehanek, J., Arrell, C. A., Pradervand, C., Ischebeck, R., Erny, C., Heimgartner, P., Gorgisyan, I., Thominet, V., Tiedtke, K., Sorokin, A., Follath, R., Makita, M., Seniutinas, G., David, C., Milne, C. J., Lemke, H., Radovic, M., Hauri, C. P. & Patthey, L. (2018). J. Synchrotron Rad. 25, 1238-1248.")
) [J. Synchrotron Rad. 25, 1238–1248] is corrected.
Keywords: FEL physics; photon diagnostics; instrumentation; hard X-rays.
Two authors, Ariana Cassar and Marco Calvi, were omitted in the published version of the paper by Juranić et al. (2018). The correct author list is given above.
References
Juranić, P., Rehanek, J., Arrell, C. A., Pradervand, C., Ischebeck, R., Erny, C., Heimgartner, P., Gorgisyan, I., Thominet, V., Tiedtke, K., Sorokin, A., Follath, R., Makita, M., Seniutinas, G., David, C., Milne, C. J., Lemke, H., Radovic, M., Hauri, C. P. & Patthey, L. (2018). J. Synchrotron Rad. 25, 1238–1248. Web of Science CrossRef IUCr Journals Google Scholar
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