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Figure 1
Schematic of the arrival timing monitor at SACLA BL1. The incident soft XFEL beam is introduced to the beam branching mirror. A small portion of the XFEL beam is reflected and focused to a GaAs wafer, while the major part of the beam is introduced to the KB mirror system and focused to the sample position. The optical laser pulses were reflected on the GaAs wafer and imaged onto the visible CCD camera with an imaging lens.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 26| Part 3| May 2019| Pages 887-890
https://doi.org/10.1107/S1600577519002315
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