Time-resolved X-ray reflection phases of the nearly forbidden Si(222) reflection under laser excitation

Tsai, Y.-W.; Chang, Y.-Y.; Lee, J.-J.; Liu, W.-C.; Wu, Y.-H.; Liu, W.-R.; Liu, H.-Y.; Lee, K.-Y.; Weng, S.-C.; Sheu, H.-S.; Chiu, M.-S.; Lee, Y.-Y.; Hsu, C.-H.; Chang, S.-L.

doi:10.1107/S1600577519003503

Journal of Synchrotron Radiation Journal of
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Figure 3
(a) Measured Si(222) intensities of Si(222)/ $[13 {\overline 1}]$ ) for 200 ps before (blue curve) and 100 ps after (red curve) the laser beam was turned on. (b) Calculated intensity profiles for panel (a).

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 26| Part 3| May 2019| Pages 819-824

https://doi.org/10.1107/S1600577519003503

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