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Figure 3
(a) Final fitted profiles [points: observed; line: calculated; lower plot: (IobsIcalc)/s.u.] from the Rietveld refinement of Zn2Mo3O8. Tick lines directly above the diffraction pattern indicate the positions of the allowed reflections. (b) Final fitted profiles [points: observed; line: calculated; lower plot: (IobsIcalc)/s.u.] from Rietveld refinement of LaMo2O5 using the disordered model in space group P63/mmc. The arrows indicate the positions of two Bragg peaks unaccounted for by our models.

Journal logoSTRUCTURAL SCIENCE
CRYSTAL ENGINEERING
MATERIALS
ISSN: 2052-5206
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