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Figure 3
X-ray patterns recorded after quenching from 293 K down to 200 K. The two lower diagrams are taken at 200 K after (part A) half an hour and (part B) 1 h, respectively. X-ray patterns are shifted in 2θ and in intensity. Dotted lines show the intensity decrease in the most important diffracted lines of NAD.

Journal logoSTRUCTURAL SCIENCE
CRYSTAL ENGINEERING
MATERIALS
ISSN: 2052-5206
Volume 57| Part 1| February 2001| Pages 27-35
doi:10.1107/S0108768100014506
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