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Figure 2
Fitting result of Rietveld refinement for x-C2S. Filled squares and solid lines represent the observed and calculated profile intensities, respectively. Plots at the bottom of the diagram represent weighted difference plots by wi 1/2(Yoi-Yci). Short vertical bars represent Bragg reflection positions of x-C2S (upper) and β-C2S (lower). The latter half of the pattern is presented on an enlarged scale.

Journal logoSTRUCTURAL SCIENCE
CRYSTAL ENGINEERING
MATERIALS
ISSN: 2052-5206
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